SYTECH - Sony Xperia SK17i - Chip-Off Examination

Sony Xperia SK17i – Chip-Off Examination – Used to provide essential case data for an ongoing investigation

Sony Xperia SK17i – SYTECH Chip-Off Examination – Used to provide essential case data for an ongoing investigation

Without this Advanced Digital Forensic technique (Chip-Off), essential case data may have been missed due to the Damaged, Inoperable and Irreparable condition of this handset.

Various JTAG (Joint Test Action Group) methods were carried out prior to this examination by SYTECH, however these met with negative results.

SYTECH - Sony Xperia SK17i - Chip-Off Examination
SYTECH – Sony Xperia SK17i – Chip-Off Examination